Photoluminescence spectroscopy is a non-contact, non-destructive method of probing the electronic structure of materials. When light is absorbed by a material a process called photo-excitation can occur. This excitation causes the material to jump to a higher electronic state before releasing energy in the form of photons as it relaxes, returning to its original energy state. The emission of light or luminescence through this process is photoluminescence (PL).
Quark Photonics offers a PL optimised series of spectrometers which can be used for wide-ranging evaluations, including compositional analysis of the epitaxial layer of compound semiconductors, defect evaluation of light-emitting materials, evaluation of surfaces, non-destructive evaluation of integrated optical circuits, quantitative analysis of impurities, and evaluation of various Laser Diodes and LEDs ranging from GaN to InP.
From confocal mapping capabilities with sub-micron spatial resolution to multiple excitation wavelengths from the UV- NIR we allow control of the penetration depth into the material, and thus, control of the volume sampled. Broadband detection of photoluminescence from UV to NIR can be achieved using our range of scientific CCD and InGaAs/NIR detectors and sample conditions can be controlled from 4 to 300 K.