Non destructive, surface sensitive techniques for measuring film thickness, optical constants, surface topography and surface structure with molecular resolution.
Surface Metrology
Showing all 9 results
SmartSE – Cost Effective Spectroscopic Ellipsometer
Smart SE: a powerful and cost effective spectroscopic ellipsometer The Smart SE from HORIBA Scientific is a versatile spectroscopic ellipsometer…AutoSE – Thin Film Measurement via Spectroscopic Ellipsometry
The Auto SE stands out in its ease of use and numerous automatic features that made the Auto SE a turnkey instrument ideal…UVISEL Plus – Spectroscopic Ellipsometer
The Reference Ellipsometer for Thin Film Measurements The UVISEL Plus ellipsometer offers the best combination of modularity and performance for…Vista series – nano-IR Atomic Force Microscope
PiFM nano‑scale chemical mapping The most advanced mapping technique available Create chemical absorption maps of nano-scale features in a matter…Combiscope
AFM and inverted light microscopy The CombiScope Atomic Force Microscope (AFM) is an advanced research instrument that provides the entry…Omegascope – nanoRaman/TERS
HORIBA’s leading Raman technology is now integrated with AIST-NT’s scanning probe microscopy (SPM). The NanoRamanTM platform integrates Atomic Force Microscopy (AFM)…S lynx – 3D Surface Profiler
S lynx is a non-contact compact 3D surface profiler designed for use in industry and research. It has been designed…S neox – 3D Optical Profilometer
The S neox outperforms existing optical 3D profiling microscopes in terms of performance, functionality, efficiency and design, providing Sensofar with…SmartSPM – Advanced stand-alone AFM
Advanced stand-alone AFM The SmartSPM Scanning Probe Microscope is the first 100% automated system that offers its cutting-edge technology of…
