Surface Metrology

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Non destructive, surface sensitive techniques for measuring film thickness, optical constants, surface topography and surface structure with molecular resolution.

  • SmartSE – Cost Effective Spectroscopic Ellipsometer

    Smart SE: a powerful and cost effective spectroscopic ellipsometer The Smart SE from HORIBA Scientific is a versatile spectroscopic ellipsometer…
  • AutoSE – Thin Film Measurement via Spectroscopic Ellipsometry

    The Auto SE stands out in its ease of use and numerous automatic features that made the Auto SE a turnkey instrument ideal…
  • UVISEL Plus – Spectroscopic Ellipsometer

    The Reference Ellipsometer for Thin Film Measurements The UVISEL Plus ellipsometer offers the best combination of modularity and performance for…
  • Vista series – nano-IR Atomic Force Microscope

    PiFM nano‑scale chemical mapping The most advanced mapping technique available Create chemical absorption maps of nano-scale features in a matter…
  • Combiscope

    AFM and inverted light microscopy The CombiScope Atomic Force Microscope (AFM) is an advanced research instrument that provides the entry…
  • Omegascope – nanoRaman/TERS

    HORIBA’s leading Raman technology is now integrated with AIST-NT’s scanning probe microscopy (SPM). The NanoRamanTM platform integrates Atomic Force Microscopy (AFM)…
  • S lynx – 3D Surface Profiler

    S lynx is a non-contact compact 3D surface profiler designed for use in industry and research. It has been designed…
  • S neox – 3D Optical Profilometer

    The S neox outperforms existing optical 3D profiling microscopes in terms of performance, functionality, efficiency and design, providing Sensofar with…
  • SmartSPM – Advanced stand-alone AFM

    Advanced stand-alone AFM The SmartSPM Scanning Probe Microscope is the first 100% automated system that offers its cutting-edge technology of…

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