SmartSPM – Advanced stand-alone AFM

Advanced stand-alone AFM

The SmartSPM Scanning Probe Microscope is the first 100% automated system that offers its cutting-edge technology of ultra-fast, metrological and high-resolution measurements for the most advanced materials research at the nanoscale in all AFM and STM modes. With the SmartSPM zooming in from large up to 100 µm overview scans down to atomic resolution has become a reality. Its design has been specially developed to be capable of being seamlessly integrated with optical spectroscopies (SNOM, Raman, Photoluminescence and TERS/SERS techniques).

Find out more product information from our supplier

Not Sure Which System  is Right For You?

We have over 40 years of experience in sales and technical support of scientific instrumentation . We can help you decide on the appropriate equipment for your needs.

Looking on behalf of your University?

We can work with you to help get the ideal instruments into your university by providing any information you require.


SmartSPM – Advanced stand-alone AFM

Automation of operation / Ease of use

  • Fully automated laser to photodiode alignment (no user click-on-spot is required!).
  • Exchanging probes has never been so easy before!
  • Fully automated configuration for the most common AFM modes.
  • Extremely fast system adjustment before starting measurements!

Resolution / Stability / Accuracy

  • One single 100µm scanner gets large scans as well as goes down to molecular or atomic resolution.
  • No vibration isolation is required for standard measurements.
  • The lowest noise closed loop sensors make it possible to have them on even during molecular resolution imaging and get the most accurate results.

Fast scanning

  • Scanner resonant frequencies >7kHz in XY and >15kHz in Z are the highest in the AFM industry today.
  • Optimised scanner control algorithms makes it possible to scan much faster than ever before!

All SPM modes included plus Nanolithography with no additional units and costs

  • Kelvin Probe Microscopy, Piezoresponse Force Microscopy, Nanolithography and Nanomanipulation are all included in the basic package!

Flexibility to upgrade to AFM-Raman

  • The SmartSPM was designed from the ground up for easy and appropriate coupling with Raman systems.

Measuring Modes

  • Contact AFM in air, and liquid (optional);
  • Semicontact AFM in air, and in liquid (optional);
  • True Non-contact AFM;
  • Dynamic Force Microscopy (DFM, FM-AFM);
  • Dissipation Force Microscopy;
  • Top Mode;
  • Phase Imaging;
  • Lateral Force Microscopy (LFM);
  • Force Modulation;
  • Conductive AFM (optional);
  • I-Top mode (optional);
  • Magnetic Force Microscopy (MFM);
  • Kelvin Probe (Surface Potential Microscopy);
  • Single-pass Kelvin Probe;
  • Capacitance Microscopy (SCM)
  • Electric Force Microscopy (EFM);
  • Single-pass MFM/EFM (“Plane scan”);
  • Force curve measurements;
  • Piezo Response Force Microscopy (PFM);
  • PFM-Top mode;
  • Nanolithography;
  • Nanomanipulation;
  • STM (optional);
  • Photocurrent Mapping (optional);
  • Volt-ampere characteristic measurements (optional);
  • Shear-force Microscopy with tuning fork (ShFM);
  • Normal Force Microscopy with tuning fork.

SmartSPM Scanner and Base

Sample scanning range: 100 µm x 100 µm x 15 µm (±10 %)

Scanning type by sample: XY non-linearity 0.05 %; Z non-linearity 0.05 %

Noise: < 0.1 nm RMS in XY dimension in 200 Hz bandwidth with capacitance sensors on; < 0.02 nm RMS in XY dimension in 100 Hz bandwidth with capacitance sensors off; < 0.04 nm RMS Z capacitance sensor in 1000 Hz bandwidth

Resonance frequency: XY: 7 kHz (unloaded); Z: 15 kHz (unloaded)

X, Y, Z movement: Digital closed loop control for X, Y, Z axes; Motorized Z approach range 18 mm

Sample size: Maximum 40 x 50 mm, 15 mm thickness

Sample positioning: Motorized sample positioning range 5 x 5 mm

Positioning resolution: 1 µm

Product Sales Enquiry







Working with you to find solutions to your scientific needs