Description
Vista One (Photo-induced Force Microscope)
Characterise at the highest resolution
Sub-10 nm PiF‑IR spectroscopy
- 1 wavenumber spectral resolution with a widely tunable laser for nano-IR experiments
- Mono-layer molecular sensitivity
Sub-10 nm PiFM nano-IR chemical mapping
- Mono-layer molecular sensitivity
- Organic and inorganic materials
Built to handle any light
A 3D-actuated parabolic mirror focuses excitation light onto the side of the tip no matter what wavelength of light is used.
Fast cantilever alignment
Our cantilever alignment chip ensures that optical alignments are maintained for both the AFM feedback and near-field lasers during cantilever changes.
Designed for high throughput measurement
- Tunable IR lasers can sweep a full PiF‑IR spectrum in as little as 100 ms.
- Use existing FTIR spectra to identify materials.
- Fixed-wavelength PiFM images can be acquired in minutes with a range of up to 80 µm in X and Y.
- Optical alignments are maintained even when changing samples.
- hyPIR™ imaging and our automated principle component analysis tools provide complete image and spectral data‑sets with minimal effort.
Capacitive sensors + optical encoders
Our motorized stage features 6 mm travel and optical encoders for precision control. The capacitive sensors in our AFM scanner ensure linear scans with a ~100 pm RMS precision.
Dual Z
Image samples faster without introducing artifacts. Our dual Z‑piezo scanner system provides accurate scans with a large 12 µm vertical range.
Invar construction
Both the head and scanner are made of invar for the best thermal stability possible.
Low profile stability
Our low-profile AFM head allows us to use top objective lenses with high numerical apertures. This provides an excellent optical view of the sample. The head also features the most stable mount configuration for low drift and acoustic stability.
